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Study on Energy Saving Technology of Night-time Illumination of Expressway Tunnel
Hua Kaicheng,
Zhao Chao,
Liao Haomiao,
Xia Yangyuyu,
Wang Zihao
Issue:
Volume 8, Issue 4, August 2020
Pages:
64-68
Received:
21 July 2020
Published:
25 August 2020
Abstract: With the continuous expansion of the scale and number of highway tunnels in China, the power consumption of highway tunnel lighting has gradually become a huge amount for operating units. How to reduce the power consumption of lighting for highway tunnels has become an important issue for operating units. However, energy saving does not mean less or no lights, the premise must be to ensure the safety and comfort of driving in the tunnel. In this study, based on the light environment characteristics of the tunnel at night, the visual resolution level of the target obstacle in front of the road is judged by the human eye ’s saccade time, and whether the reduction of road lighting brightness under the effect of the headlights will affect the driver ’s visual resolution level. The results show that the turning on of the car's high beam lights has a certain effect on the driver's visual perception ability; when the average brightness of the road surface is 1.0cd/m2, the tester's saccade and fixation time on the target obstacle are less than 0.5cd/m2, But the driver has no significant difference in the resolution of the target obstacles under these two brightness levels; when the brightness of the road surface is 0.5 cd/m2, the driver still has confidence in the situation ahead; it is recommended that the entrance and exit have a certain distance The tunnel brightness can be adjusted to 0.5cd/m2.
Abstract: With the continuous expansion of the scale and number of highway tunnels in China, the power consumption of highway tunnel lighting has gradually become a huge amount for operating units. How to reduce the power consumption of lighting for highway tunnels has become an important issue for operating units. However, energy saving does not mean less o...
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Analysis and Solution of Abnormal Fault of Data Storage Based on NAND-flash
Zhao Long,
Shen Xiaohe,
Chen Geng,
Hu Xiaoxi
Issue:
Volume 8, Issue 4, August 2020
Pages:
69-73
Received:
18 June 2020
Published:
25 August 2020
Abstract: NAND-flash memory has the advantages of large capacity and fast rewriting speed. It is suitable for the storage of large amounts of data and is often used as an online storage device for embedded products. However, NAND-flash has the problems of bad blocks and other insufficient reliability.In a certain aerospace model temperature/strain measurement system, the NAND-flash memory is erased and written through DSP software, and the strain/temperature measurement data collected by the sensor is stored in real time. After the system was powered on many times and completed data collection and decoding, it was found that the data stored in the NAND-flash had abnormal faults. By analyzing the test phenomenon and failure mechanism, the failure problem is attributed to the fact that the data in the NAND-flash is not erased, and it is coupled with the newly written data, and it is finally located because the data in the original data address cannot be effectively erased when the data address is stored. Coupling also occurred, resulting in an error in the data address, and the data was coupled after power-on again. Based on the above-mentioned reasons, this paper proposed a troubleshooting method and conducted a test. The verification was successfully passed and the problem was resolved.This method has high reference significance in the large-capacity and high-reliability data storage of NAND-flash in the field of aerospace models.
Abstract: NAND-flash memory has the advantages of large capacity and fast rewriting speed. It is suitable for the storage of large amounts of data and is often used as an online storage device for embedded products. However, NAND-flash has the problems of bad blocks and other insufficient reliability.In a certain aerospace model temperature/strain measuremen...
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A FPGA Serial Port Transmission Fault Analysis and Design Optimization
Shen Xiaohe,
Niu Jing,
Hu Xiaoxi
Issue:
Volume 8, Issue 4, August 2020
Pages:
74-78
Received:
21 June 2020
Published:
25 August 2020
Abstract: One of the functions of FPGA in a satellite equipment is to receive data framing instructions from main control system, solve the data of the sensor at this time, and send the data through the serial port according to the format of response frame. In the system joint debugging, a small amount of data sent by serial port are not collected correctly by the receiving equipment, and the fault happened by accident. This paper analyzes the reason of this fault and puts forward an effective solution to this problem. First of all, this paper analyzes the principle of serial port transmitting function and the fault phenomenon. It is found that the failure function is the FPGA serial port transmitting. Then, the serial transmission function of FPGA is further decomposed to list all possible cases, and the fault is reproduced in the function simulation by using Questa Sim. This paper carefully analyzes the mechanism of this failure and the probability of this failure. Finally, this paper proposed a solution, which is proved to be effective by experiments. This paper gives corresponding suggestions from three aspects of software design, engineering implementation and system testing. This has reference significance for the future engineering application.
Abstract: One of the functions of FPGA in a satellite equipment is to receive data framing instructions from main control system, solve the data of the sensor at this time, and send the data through the serial port according to the format of response frame. In the system joint debugging, a small amount of data sent by serial port are not collected correctly ...
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