Journal of Electrical and Electronic Engineering

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Volume 1, Issue 3, August 2013

  • By-Emitter Emulation of the Degradation of a Calibrated 975 nm Tapered Laser Bar Using a Laser Diode Simulation/Emulation Tool

    Christian Kwaku Amuzuvi, Seth Ofori

    Issue: Volume 1, Issue 3, August 2013
    Pages: 55-60
    Received: 15 July 2013
    Published: 20 August 2013
    DOI: 10.11648/j.jeee.20130103.11
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    Abstract: In this paper, Barlase has been taken a step further by emulating the degradation processes in high power semiconductor laser bars to further deepen the understanding of the behaviour of laser bars. In publications elsewhere where Barlase was used, investigations were done using hypothetical laser bars to emulate various degradation processes commo... Show More
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  • Handling MANET Routing Attacks Using Risk Aware Mitigation Mechanism with Distributed Node Control

    A. Jaganraj, A. Yogaraj, N. Vignesh, R. V. Anuroop

    Issue: Volume 1, Issue 3, August 2013
    Pages: 61-67
    Received: 20 July 2013
    Published: 20 August 2013
    DOI: 10.11648/j.jeee.20130103.12
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    Abstract: Mobile Ad hoc Networks (MANET) have been highly vulnerable to attacks due to the dynamic nature of its network infrastructure. Among these attacks, routing attacks have received considerable attention since it could cause the most devastating damage to MANET. Even though there exist several intrusion response techniques to mitigate such critical at... Show More
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