Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology

Wang Shun Shen Peter; Wang Yin Tien; Chao Chong Lii; Yang Wei Bin; Lee Tzung Hang

doi:doi:10.11648/j.ajece.20210502.16

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Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology

Wang Shun Shen Peter, Wang Yin Tien, Chao Chong Lii, Yang Wei Bin, Lee Tzung Hang

Published in American Journal of Electrical and Computer Engineering (Volume 5, Issue 2)

Received: 8 November 2021 Accepted: 22 November 2021 Published: 24 November 2021

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Abstract

This paper proposes several Python-based test methods to study a series of MCU-associated sensors. In light of today's automotive electronics, many electric systems are involved in modularized bare dies such as power management ICs along with embedded programming. As to the application of autonomous driving like the ADAS system, having many Multiple-Chips Modules (MCM) which are popular in SoC related functional boards. It is necessary to have these electrical systems follow stringent safety standards and regulations by the International Electrotechnical Commission (IEC). That is to ensure the electronic systems to be designed, implemented, operated within safety range. That is traceable according to the prerequisite Safety Integrity Level (SIL) besides the Automotive Safety Integrity Level (ASIL) towards five classes. These classes further evolved into higher requirements such as IEC-61508 and more recently the ISO-26262. All of these, have driven many companies to research and develop a suite of methods and strategies to solve some of the “reliability” associated issues, especially in the area of autonomous driving. This paper proposes the boundary scan based test methodology to cop with government’s regulations by tracking some of the major sensors in responses to motion, temperature and dynamic forces based on a JTAG’s sensor board in case study A. Thereafter, using an NXP’s automotive board to trace on board electronics, mainly the CPU and MCU via the MODBUS is made possible to log and record test results through VB.XML.NET. These languages speak uniformly to the relational data base in one “DataSet” by in-memory cache of the data retrieved from a database, in case study B. Both are realized by the JTAG’s Functional Test (JFT) system, to log the “pass or fail” results in a sequential execution. This paper illustrates how-to reach this goal through the process in use of the public-domain based open frame-ware, and to demonstrate them on a JTAG’s Provision platform throughout the development stages.

Published in	American Journal of Electrical and Computer Engineering (Volume 5, Issue 2)
DOI	10.11648/j.ajece.20210502.16
Page(s)	88-97
Creative Commons	This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.
Copyright	Copyright © The Author(s), 2021. Published by Science Publishing Group

Keywords

ADAS, Boundary Scan, MCM, JTAG, BST, BIST, Automotive Electronics, Autonomous Vehicles

References

[1]	Wang Shun Shen Peter “Instrumentation of Twin-MCM based Mutual Test”, published by “Microelectronics Journal”, Vol. 114 on August 21, 2021, http://doi.org.j.mejo.2021.105108.
[2]	Wang Shun Shen Peter, IEEE/International Test Conference, Washington D.C. 2020, Nov. 6-10, published on http://dx.doi.org/10.6180/, “Switch Mode Interposer developed to self-test an MCM without Known Good Dice”, preprint on https://easychair.org/publications/preprint_open.
[3]	Wang, Shun Shen Peter, Wu Tien-Yu, “Wafer Scale Rerouting Process in making Known Good Dies”, accepted by Journal of “Nan Kai University of Technology”, Taichung, Taiwan, ISSN-1991-492x.
[4]	Wang, Shun Shen Peter, “Method of making a High-Density Multi-Layer Wiring Board”, U.S. Patent No. 6,026,564.
[5]	Wang Shun Shen Peter and Chee Wong, “Wafer Scale Burn-in Testing”, U.S. Patent No. 6,121,065 assigned to IME, University of Singapore.
[6]	Wang Shun Shen Peter, “Method and Arrangement for analyzing manufacturing defects of Multi-Chip-Module without Known Good Dies”, U.S. Patent Pending No. 17076496.
[7]	Wang, Shun Shen Peter, “Switch-Mode based interposer enabling Self-Testing of an MCM without Known-Good-Die” U.S. Patent Pending No. 17240956.
[8]	Harry Bleeker and Peter van den Eijnden: “Boundary Scan Test A Practical Approach”, published book by Eluwer Academic, Netherlands @1993.
[9]	Data sheet: AN5375, The S32R27x is a 32-bit Power Architecture® based Microcontroller Unit (MCU) targeted for automotive applications.
[10]	NXP document: introduces a complete system power solution using FS84/FS85 and PF502x family such as PF5020, PF5023, and PF5024.
[11]	Data sheet NXP TEF810X, an automotive radar transceiver for all range radar applications, covering the full car radar frequency band from 76 GHz to 81 GHz.
[12]	Data sheet: NXP MCUs: strike the optimal performance-per-watt balance for hardware-accelerated, high-resolution RADAR systems designed for safer, smarter vehicle.
[13]	https://www.rtautomation.com/technologies/modbus-rtu/, RTU in automation.
[14]	https://www.autonomousvehiclesymposium.com/detroit/en/, autonomeous vehilcles safety.
[15]	https://EEtimes.com/autonomous-vehicle-test-development, autonomous vehicles test development.
[16]	https://www.researchgate.net/publication/301272911, Challenges_in_Autonomous_Vehicle_Testing_Validation.
[17]	https://www.renesas.com/us/en/products/automotive-products/automotive-system-chips-socs.
[18]	https://datasheet.lcsc.com/lcsc/1811091610_NXP-Semicon-MCIMX6Q5EYM10AD_C133182.pdf.
[19]	Peter Wang Retrieved from www.jtag.com, Oct. 10, 2021.

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APA Style

Wang Shun Shen Peter, Wang Yin Tien, Chao Chong Lii, Yang Wei Bin, Lee Tzung Hang. (2021). Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology. American Journal of Electrical and Computer Engineering, 5(2), 88-97. https://doi.org/10.11648/j.ajece.20210502.16

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ACS Style

Wang Shun Shen Peter; Wang Yin Tien; Chao Chong Lii; Yang Wei Bin; Lee Tzung Hang. Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology. Am. J. Electr. Comput. Eng. 2021, 5(2), 88-97. doi: 10.11648/j.ajece.20210502.16

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AMA Style

Wang Shun Shen Peter, Wang Yin Tien, Chao Chong Lii, Yang Wei Bin, Lee Tzung Hang. Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology. Am J Electr Comput Eng. 2021;5(2):88-97. doi: 10.11648/j.ajece.20210502.16

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@article{10.11648/j.ajece.20210502.16,
  author = {Wang Shun Shen Peter and Wang Yin Tien and Chao Chong Lii and Yang Wei Bin and Lee Tzung Hang},
  title = {Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology},
  journal = {American Journal of Electrical and Computer Engineering},
  volume = {5},
  number = {2},
  pages = {88-97},
  doi = {10.11648/j.ajece.20210502.16},
  url = {https://doi.org/10.11648/j.ajece.20210502.16},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajece.20210502.16},
  abstract = {This paper proposes several Python-based test methods to study a series of MCU-associated sensors. In light of today's automotive electronics, many electric systems are involved in modularized bare dies such as power management ICs along with embedded programming. As to the application of autonomous driving like the ADAS system, having many Multiple-Chips Modules (MCM) which are popular in SoC related functional boards. It is necessary to have these electrical systems follow stringent safety standards and regulations by the International Electrotechnical Commission (IEC). That is to ensure the electronic systems to be designed, implemented, operated within safety range. That is traceable according to the prerequisite Safety Integrity Level (SIL) besides the Automotive Safety Integrity Level (ASIL) towards five classes. These classes further evolved into higher requirements such as IEC-61508 and more recently the ISO-26262. All of these, have driven many companies to research and develop a suite of methods and strategies to solve some of the “reliability” associated issues, especially in the area of autonomous driving. This paper proposes the boundary scan based test methodology to cop with government’s regulations by tracking some of the major sensors in responses to motion, temperature and dynamic forces based on a JTAG’s sensor board in case study A. Thereafter, using an NXP’s automotive board to trace on board electronics, mainly the CPU and MCU via the MODBUS is made possible to log and record test results through VB.XML.NET. These languages speak uniformly to the relational data base in one “DataSet” by in-memory cache of the data retrieved from a database, in case study B. Both are realized by the JTAG’s Functional Test (JFT) system, to log the “pass or fail” results in a sequential execution. This paper illustrates how-to reach this goal through the process in use of the public-domain based open frame-ware, and to demonstrate them on a JTAG’s Provision platform throughout the development stages.},
 year = {2021}
}

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TY  - JOUR
T1  - Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology
AU  - Wang Shun Shen Peter
AU  - Wang Yin Tien
AU  - Chao Chong Lii
AU  - Yang Wei Bin
AU  - Lee Tzung Hang
Y1  - 2021/11/24
PY  - 2021
N1  - https://doi.org/10.11648/j.ajece.20210502.16
DO  - 10.11648/j.ajece.20210502.16
T2  - American Journal of Electrical and Computer Engineering
JF  - American Journal of Electrical and Computer Engineering
JO  - American Journal of Electrical and Computer Engineering
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EP  - 97
PB  - Science Publishing Group
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UR  - https://doi.org/10.11648/j.ajece.20210502.16
AB  - This paper proposes several Python-based test methods to study a series of MCU-associated sensors. In light of today's automotive electronics, many electric systems are involved in modularized bare dies such as power management ICs along with embedded programming. As to the application of autonomous driving like the ADAS system, having many Multiple-Chips Modules (MCM) which are popular in SoC related functional boards. It is necessary to have these electrical systems follow stringent safety standards and regulations by the International Electrotechnical Commission (IEC). That is to ensure the electronic systems to be designed, implemented, operated within safety range. That is traceable according to the prerequisite Safety Integrity Level (SIL) besides the Automotive Safety Integrity Level (ASIL) towards five classes. These classes further evolved into higher requirements such as IEC-61508 and more recently the ISO-26262. All of these, have driven many companies to research and develop a suite of methods and strategies to solve some of the “reliability” associated issues, especially in the area of autonomous driving. This paper proposes the boundary scan based test methodology to cop with government’s regulations by tracking some of the major sensors in responses to motion, temperature and dynamic forces based on a JTAG’s sensor board in case study A. Thereafter, using an NXP’s automotive board to trace on board electronics, mainly the CPU and MCU via the MODBUS is made possible to log and record test results through VB.XML.NET. These languages speak uniformly to the relational data base in one “DataSet” by in-memory cache of the data retrieved from a database, in case study B. Both are realized by the JTAG’s Functional Test (JFT) system, to log the “pass or fail” results in a sequential execution. This paper illustrates how-to reach this goal through the process in use of the public-domain based open frame-ware, and to demonstrate them on a JTAG’s Provision platform throughout the development stages.
VL  - 5
IS  - 2
ER  -

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Author Information

Wang Shun Shen Peter

Department of Mechanical and Electrical Engineering, Tam Kang University, Taipei, Taiwan, ROC
Wang Yin Tien

Department of Mechanical and Electrical Engineering, Tam Kang University, Taipei, Taiwan, ROC
Chao Chong Lii

Department of Mechanical and Electrical Engineering, Tam Kang University, Taipei, Taiwan, ROC
Yang Wei Bin

Department of Electrical and Computer Engineering, Tam Kang University, Taipei, Taiwan, ROC
Lee Tzung Hang

Department of Mechanical and Electrical Engineering, Tam Kang University, Taipei, Taiwan, ROC

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Plain Text BibTeX RIS

APA Style

Wang Shun Shen Peter, Wang Yin Tien, Chao Chong Lii, Yang Wei Bin, Lee Tzung Hang. (2021). Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology. American Journal of Electrical and Computer Engineering, 5(2), 88-97. https://doi.org/10.11648/j.ajece.20210502.16

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ACS Style

Wang Shun Shen Peter; Wang Yin Tien; Chao Chong Lii; Yang Wei Bin; Lee Tzung Hang. Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology. Am. J. Electr. Comput. Eng. 2021, 5(2), 88-97. doi: 10.11648/j.ajece.20210502.16

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AMA Style

Wang Shun Shen Peter, Wang Yin Tien, Chao Chong Lii, Yang Wei Bin, Lee Tzung Hang. Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology. Am J Electr Comput Eng. 2021;5(2):88-97. doi: 10.11648/j.ajece.20210502.16

Copy | Download

@article{10.11648/j.ajece.20210502.16,
  author = {Wang Shun Shen Peter and Wang Yin Tien and Chao Chong Lii and Yang Wei Bin and Lee Tzung Hang},
  title = {Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology},
  journal = {American Journal of Electrical and Computer Engineering},
  volume = {5},
  number = {2},
  pages = {88-97},
  doi = {10.11648/j.ajece.20210502.16},
  url = {https://doi.org/10.11648/j.ajece.20210502.16},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajece.20210502.16},
  abstract = {This paper proposes several Python-based test methods to study a series of MCU-associated sensors. In light of today's automotive electronics, many electric systems are involved in modularized bare dies such as power management ICs along with embedded programming. As to the application of autonomous driving like the ADAS system, having many Multiple-Chips Modules (MCM) which are popular in SoC related functional boards. It is necessary to have these electrical systems follow stringent safety standards and regulations by the International Electrotechnical Commission (IEC). That is to ensure the electronic systems to be designed, implemented, operated within safety range. That is traceable according to the prerequisite Safety Integrity Level (SIL) besides the Automotive Safety Integrity Level (ASIL) towards five classes. These classes further evolved into higher requirements such as IEC-61508 and more recently the ISO-26262. All of these, have driven many companies to research and develop a suite of methods and strategies to solve some of the “reliability” associated issues, especially in the area of autonomous driving. This paper proposes the boundary scan based test methodology to cop with government’s regulations by tracking some of the major sensors in responses to motion, temperature and dynamic forces based on a JTAG’s sensor board in case study A. Thereafter, using an NXP’s automotive board to trace on board electronics, mainly the CPU and MCU via the MODBUS is made possible to log and record test results through VB.XML.NET. These languages speak uniformly to the relational data base in one “DataSet” by in-memory cache of the data retrieved from a database, in case study B. Both are realized by the JTAG’s Functional Test (JFT) system, to log the “pass or fail” results in a sequential execution. This paper illustrates how-to reach this goal through the process in use of the public-domain based open frame-ware, and to demonstrate them on a JTAG’s Provision platform throughout the development stages.},
 year = {2021}
}

Copy | Download

TY  - JOUR
T1  - Tracking Automotive Electronics Related Sensory and Their Traceability by Boundary Scan Technology
AU  - Wang Shun Shen Peter
AU  - Wang Yin Tien
AU  - Chao Chong Lii
AU  - Yang Wei Bin
AU  - Lee Tzung Hang
Y1  - 2021/11/24
PY  - 2021
N1  - https://doi.org/10.11648/j.ajece.20210502.16
DO  - 10.11648/j.ajece.20210502.16
T2  - American Journal of Electrical and Computer Engineering
JF  - American Journal of Electrical and Computer Engineering
JO  - American Journal of Electrical and Computer Engineering
SP  - 88
EP  - 97
PB  - Science Publishing Group
SN  - 2640-0502
UR  - https://doi.org/10.11648/j.ajece.20210502.16
AB  - This paper proposes several Python-based test methods to study a series of MCU-associated sensors. In light of today's automotive electronics, many electric systems are involved in modularized bare dies such as power management ICs along with embedded programming. As to the application of autonomous driving like the ADAS system, having many Multiple-Chips Modules (MCM) which are popular in SoC related functional boards. It is necessary to have these electrical systems follow stringent safety standards and regulations by the International Electrotechnical Commission (IEC). That is to ensure the electronic systems to be designed, implemented, operated within safety range. That is traceable according to the prerequisite Safety Integrity Level (SIL) besides the Automotive Safety Integrity Level (ASIL) towards five classes. These classes further evolved into higher requirements such as IEC-61508 and more recently the ISO-26262. All of these, have driven many companies to research and develop a suite of methods and strategies to solve some of the “reliability” associated issues, especially in the area of autonomous driving. This paper proposes the boundary scan based test methodology to cop with government’s regulations by tracking some of the major sensors in responses to motion, temperature and dynamic forces based on a JTAG’s sensor board in case study A. Thereafter, using an NXP’s automotive board to trace on board electronics, mainly the CPU and MCU via the MODBUS is made possible to log and record test results through VB.XML.NET. These languages speak uniformly to the relational data base in one “DataSet” by in-memory cache of the data retrieved from a database, in case study B. Both are realized by the JTAG’s Functional Test (JFT) system, to log the “pass or fail” results in a sequential execution. This paper illustrates how-to reach this goal through the process in use of the public-domain based open frame-ware, and to demonstrate them on a JTAG’s Provision platform throughout the development stages.
VL  - 5
IS  - 2
ER  -

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